EXPERIENCE
2017 > Compact Modeling Engineer @ Texas Instruments, Dallas, TX
compact model extraction of semiconductor devices for embedded and analog applications
improvement of 1/f noise compact model based on Verilog A
Python script development for silicon and model data analysis
statistical and mismatch data analysis and compact modeling thereof
digital circuit FOM analysis for corner model extraction
interaction with design teams for model related trouble-shooting
interaction with process integration teams for model target/spread discussions
2016 > 2016 Compact Modeling Intern @ Texas Instruments, Dallas, TX
compact 1/f noise model development using Verilog A and Spectre
2011 > 2016 Research Assistant @ Microelectronics Research Center (MRC), Austin, TX
demonstrated graphene-hBN hetero-structure 2D tunneling FET
implementation & characterization of graphene tunneling devices and other 2D FETs
journal review for
IEEE Journal of the Electron Devices Society
IEEE Electron Device Letters
Journal of Vacuum Science and Technology B
ACS Nano Letters
NPJ 2D Materials
2007 > 2011 Device Engineer @ Hynix Semiconductor Inc., Icheon, Korea
DRAM Device Technology Team | Peripheral Devices
development and ramp-up of 44-nm DRAM
reliability improvement for 3x-nm and 2x-nm node
assessing eSiGe and high-k dielectric for peripheral device application
evaluation of novel cold and carbon implant technologies
technology road mapping with ion implant equipment manufacturers
2006 > 2007 Research Assistant @ Inter-university Semiconductor Research Center, Seoul, Korea
demonstrated room temperature operation of silicon single-electron transistor
improvement of fine line patterning capability of electron beam lithography equipment
RESEARCH INTERESTS
2016 > Texas Instruments Inc.
limitations of BSIM models for pocket implanted MOSFETs
corner model methodology for digital circuits
2011 > 2016 University of Texas at Austin
novel graphene-based tunneling FET (BiSFET & ITFET) implementation
layered two-dimensional heterostructures
process induced variations in graphene FETs
2007 > 2011 Hynix Semiconductor Inc.
application of high-k dielectrics & eSiGe to DRAM peripheral devices
application of novel ion implantation technology to DRAM peripheral devices
device reliability of DRAM high voltage peripheral devices
2004 > 2007 Seoul National University
scaling limits of CMOS
silicon-based single-electron transistor (SET) implementation
Sangwoo Kang was born in Seoul, South Korea, but lived most of his childhood life abroad in the US and UK. He received his BS and MS degrees in electrical engineering at Seoul National University where he studied CMOS scaling limits and single-electron transistors. He worked at Hynix Semiconductors for four years as a DRAM device engineer focusing on peripheral device development and ramp. He then went on to pursue his Ph D at the University of Texas at Austin where he studied 2D material based tunneling devices. He is currently working as a modeling engineer at Texas Instruments where he is delivering compact device models for embedded and analog products.